Scanning Electron Microscopy: Instrumentation & Analysis


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question 1 of 3

The electron microscope was invented in 1931 by Max Knoll and Ernst Ruska in order to help solve what problem with optical microscopes?

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1. What types of lenses are used within a scanning electron microscope?

2. Which component of a scanning electron microscope focuses the electron beam down onto the sample that is being studied?

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About This Quiz & Worksheet

This short quiz and worksheet assessment tool allows you to quickly determine what you know about the SEM. You will need to be familiar with the components of the SEM and the way in which this microscope works in order to correctly answer all quiz questions.

Quiz & Worksheet Goals

You will be expected to do the following when you use this assessment:

  • Explain what problem the SEM was invented to solve
  • Name the type of lenses used within an SEM
  • Note the component of the SEM that focuses the electron beam down onto the sample
  • Explain why you would use backscattered electrons to analyze a sample in an SEM
  • Describe the type of spectroscopy is used to identify different elements within a sample with an SEM

Skills Practiced

  • Reading comprehension - ensure that you draw the most important information from the lesson, such as what problems the SEM was invented to address
  • Interpreting information - verify that you can read information about the use of backscattered electrons in sample analyses in an SEM and interpret it correctly
  • Information recall - access the knowledge you've gained regarding what SEM component focuses the electron beam onto the sample

Additional Learning

The lesson titled Scanning Electron Microscopy: Instrumentation & Analysis allows you to more closely examine details about this device. You can learn more about:

  • What theoretical resolution limit of the SEM was in 1944 compared to optical microscopes
  • What the condenser lens of an SEM is made of
  • How the apertures of an SEM work and what they are used for
  • Where the sample being studied with an SEM is held